High-resolution RBS: a powerful tool for atomic level characterization
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference24 articles.
1. Rutherford Scattering of Protons in the Surface Layers of a Tungsten Single Crystal
2. An application of high energy-resolution scattering measurements in channeling studies
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4. Monolayer analysis in Rutherford backscattering spectroscopy
5. A high-resolution electrostatic spectrometer for the investigation of near-surface layers in solids by high-resolution Rutherford backscattering with MeV ions
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