Terrestrial neutron induced failure rate measurement of SiC MOSFETs using China spallation neutron source
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference28 articles.
1. Terrestrial cosmic ray intensities;Ziegler;IBM J. Res. Dev.,1998
2. Effect of cosmic rays on computer memories;Ziegler;Science,1979
3. Single event burnout of high-power diodes;Maier;Nucl. Instr. Meth. Phys. Res. B,1998
4. Cosmic ray neutron-induced single-event burnout in power devices;Shoji;IET Power Electronics,2015
5. Sensitive volume and triggering criteria of SEB in classic planar VDMOS;Luu;IEEE Trans. Nucl. Sci.,2010
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1. Atmospheric neutron-induced single event burnout characterization of 4.5 kV Si IGBTs with spallation neutron irradiation;Semiconductor Science and Technology;2024-07-24
2. 1.5-kV AlGaN/GaN MIS-HEMT With 3-D Stacking Pad-Connected Schottky Structure Demonstrating Radiation Robustness Against Atmospheric Neutrons;IEEE Electron Device Letters;2024-07
3. Influence of Temperature on Atmospheric Neutron Induced SEB Failure Rate for SiC MOSFETs;IEEE Transactions on Nuclear Science;2023
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