Many-hit model calculations for track etch rate in CR-39 SSNTD using confocal microscope data

Author:

Fromm M.,Awad E.M.,Ditlov V.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Strong etching formulation (time and rate) for PADC with deep depth bulk etch rate study;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2021-07

2. Measurement of reduced radii, depths, and optical densities of pits using computer analysis of micrographs of CR-39 plates etched after irradiation with 12C ion beam;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-12

3. Strong etching investigation on PADC CR-39 as a thick track membrane with deep depth profile study;Radiation Physics and Chemistry;2020-12

4. Bulk etch rates of CR-39 nuclear track detectors over a wide range of etchant (NaOH aqueous solution + ethanol) concentrations: measurements and modeling;Radiation Effects and Defects in Solids;2020-08-27

5. Bulk etch rate for PADC CR-39 at extended concentration range of NaOH mixed with ethanol and etchant viscosity study;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-02

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