Applicability of the multi-hit model to calculate the track etch rate in µm-scale in CR-39 detectors
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics,General Materials Science,Nuclear and High Energy Physics,Radiation
Link
http://www.tandfonline.com/doi/pdf/10.1080/1042015031000099780
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Strong etching formulation (time and rate) for PADC with deep depth bulk etch rate study;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2021-07
2. Bulk etch rates of CR-39 nuclear track detectors over a wide range of etchant (NaOH aqueous solution + ethanol) concentrations: measurements and modeling;Radiation Effects and Defects in Solids;2020-08-27
3. Bulk etch rate for PADC CR-39 at extended concentration range of NaOH mixed with ethanol and etchant viscosity study;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-02
4. Multi-hit model on CR-39, DAM-ADC and LR-115 SSNTDs: Statistical and comparative study;Radiation Measurements;2017-10
5. The Bragg-peak studies in CR-39 SSNTD on the basis of many-hit model for track etch rates;Radiation Measurements;2005-11
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