Sputtering by highly charged ions: Application of the XY–TOF technique to secondary ion ejection from LiF
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference22 articles.
1. Energy and angular distributions of sputtered particles
2. Sputtering: survey of observations and derived principles
3. Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline Targets
4. Sputtering from elastic‐collision spikes in heavy‐ion‐bombarded metals
5. Interaction of slow, very highly charged ions with surfaces
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1. Sputtering of LiF and other halide crystals in the electronic energy loss regime;The European Physical Journal D;2020-07
2. Selective injection locking of a multi-mode semiconductor laser to a multi-frequency reference beam;The European Physical Journal D;2014-07
3. Strong perturbation effects in heavy ion induced electronic sputtering of lithium fluoride;The European Physical Journal D;2014-07
4. Electronic sputtering of LiF by Krypton (10 MeV/u): size dependent energy distributions of Li+(LiF)n clusters;The European Physical Journal D;2012-11
5. Secondary ion emission dynamics of solid ammonia bombarded by heavy ions;The European Physical Journal D;2012-10
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