Determination of PIXE spectra from specific depths-Reference-Cited by-同舟云学术

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Determination of PIXE spectra from specific depths

Published:2006-08 Issue:1-2 Volume:249 Page:808-811
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Broadhurst Anna,Lane David W.,Rogers Keith D.,Lowe Tim W.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference8 articles.

1. PIXE depth profiling

2. A new method for determining the depth profile of trace elements by PIXE

3. Reconstruction of Ar depth profiles from PIXE measurements

4. Application of an iterative maximum-likelihood algorithm in PIXE depth profiling of trace elements

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray Spectrometry;Analytical Chemistry;2008-05-24

2. Concentration profiles in paint layers studied by differential PIXE;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2008-05

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