Author:
Jakšić M.,Vajić M.,Fazinić S.,Rendić D.,Tadić T.,Valković V.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
8 articles.
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1. Determination of PIXE spectra from specific depths;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-08
2. PIXE depth profiling using variation of detection angle;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-08
3. Application of MeV carbon ions for PIXE measurements in silicon and high-Tc superconductors;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-04
4. PIXE gadgets;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-03
5. Application of charged-particle beams in science and technology;La Rivista del Nuovo Cimento;1992-03