Ion beam characterization of advanced luminescent materials for application in radiation effects microscopy-Reference-Cited by-同舟云学术

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Ion beam characterization of advanced luminescent materials for application in radiation effects microscopy

Published:2011-10 Issue:20 Volume:269 Page:2326-2329
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Branson J.V.,Hattar K.,Rossi P.,Vizkelethy G.,Powell C.J.,Hernandez-Sanchez B.,Doyle B.L.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference8 articles.

1. Ion-induced emission microscopies

2. Ion photon emission microscopy

3. Performance of an alpha-IPEM

4. Radiation effects microscopy for failure analysis of microelectronic devices

5. Nuclear emission microscopies

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1. In situ luminescence measurements of GaN/Al₂O₃ film under different energy proton irradiations;Chinese Physics B;2024-04-01

2. Thermal Stability and Radiation Tolerance of Lanthanide-Doped Cerium Oxide Nanocubes;Crystals;2021-11-11

3. Ion Photon Emission Microscope for Single Event Effect Testing in CIAE;Chinese Physics Letters;2017-07

4. InGaN/GaN multiple quantum well for fast scintillation application: radioluminescence and photoluminescence study;Nanotechnology;2014-10-20

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