Ion-induced emission microscopies-Reference-Cited by-同舟云学术

Ion-induced emission microscopies

Published:2003-02 Issue:1 Volume:3 Page:31-34
ISSN:1567-1739
Container-title:Current Applied Physics
language:en
Short-container-title:Current Applied Physics

Author:

Doyle B.L.,Walsh D.S.,Vizkelethy G.,Rossi P.,McDaniel F.D.,Schenkel T.,McDonald J.,Hamza A.V.

Publisher

Elsevier BV

Subject

General Physics and Astronomy,General Materials Science

Reference5 articles.

1. Nuclear emission microscopies

2. A new approach to nuclear microscopy: the ion–electron emission microscope

3. Axial ion–electron emission microscopy of IC radiation hardness

4. Highly charged ion based time-of-flight emission microscope;Hamza;Rev. Sci. Instrum.,2000

5. P. Rossi, B.L. Doyle, J.A.Banks, A. Battistella, G. Gennaro, F.D. McDaniel, M. Mellon, E. Vittone, G. Vizkelethy, N.D. Wing, in: Proceedings International Conference of Nuclear Microprobe Techniques and Analysis, September 2002

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