The study of Ga+ FIB implanting crystal silicon and subsequent annealing
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference16 articles.
1. Conductance Oscillations in Low-Dimensional Ion Implanted Regions Annealed by Rapid Thermal Annealing
2. J.F. Ziegler, Ion Implantation: Science and Technology, Ion Implantation Technology Co, 1996.
3. Nanoscale effects in focused ion beam processing
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