Applications for Nanoscale X-ray Imaging at High Pressure-Reference-Cited by-同舟云学术

Applications for Nanoscale X-ray Imaging at High Pressure

Published:2019-06 Issue:3 Volume:5 Page:479-489
ISSN:2095-8099
Container-title:Engineering
language:en
Short-container-title:Engineering

Author:

Mao Wendy L.,Lin Yu,Liu Yijin,Liu Jin

Funder

U.S. Department of Energy

Publisher

Elsevier BV

Subject

General Engineering,Energy Engineering and Power Technology,Materials Science (miscellaneous),General Chemical Engineering,Environmental Engineering,General Computer Science

Reference51 articles.

1. The most incompressible metal osmium at static pressures above 750 gigapascals;Dubrovinsky;Nature,2015

2. Theory and practice—diamond-anvil cells and probes for high P-T mineral physics studies;Mao,2007

3. Centennial of Röntgen’s discovery of X-rays;Frankel;West J Med,1996

4. Comparison of medical and industrial X-ray computed tomography for non-destructive testing;Du Plessis;Case Stud Nondestr Test Eval,2016

5. X-ray microtomography;Landis;Mater Charact,2010

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1. In Situ Measurement Techniques Using Diamond Anvil Cell at High Pressure–Temperature Conditions: A Review;physica status solidi (RRL) – Rapid Research Letters;2024-06-05

2. Development of a transmission X-ray nanometer-resolution microscope based on laboratory light source;Acta Physica Sinica;2024

3. Ellipsometric Measurement of the Refractive Index of Monocrystalline Silicon in a Diamond Anvil Cell;ACTA PHOTONICA SINIC;2023

4. A Viewpoint on X-ray Tomography Imaging in Electrocatalysis;ACS Catalysis;2023-07-18

5. X-ray diffraction imaging of the diamond anvils based on the microfocus x-ray source with a liquid anode;Review of Scientific Instruments;2022-08-01