X-ray diffraction imaging of the diamond anvils based on the microfocus x-ray source with a liquid anode

Abstract

This paper presents the results of using laboratory x-ray systems in the study of the crystal structure of anvil made from single-crystal diamond. The system is equipped with an Excillum MetalJet D2 + 70 kV high-brightness x-ray source with a liquid GaIn anode. The x-ray diffraction imaging (topography) technique with the use of a high-resolution x-ray Rigaku camera was applied to analyze crystal structure defects. Two-dimensional images were experimentally recorded using 400 and 111 reflections with a resolution of 1.5 and 5  μm, respectively. These topograms displayed various defects, such as growth striations and dislocations. Possible applications of the proposed laboratory-based optical scheme for high-pressure physics are discussed and future improvements to the setup are suggested.