1. Measurement of the emitter saturation current by a contactless photoconductivity decay method;Kane;in: Proceedings of the 18th IEEE Photovoltaic Specialists Conference, Las Vagas, USA,1985
2. Recombination activity of interstitial iron and other transition metal point defects in p- and n-type crystalline silicon;Macdonald;Applied Physics Letters,2004
3. Uncertainty in photoconductance lifetime measurements that use an inductive-coil detector;McIntosh;in: Proceedings of the 23rd European Photovoltaic and Solar Energy Conversion, Valencia, Spain,2008
4. On the determination of the emitter saturation current density from lifetime measurements of silicon devices;Mackel;Progress in Photovoltaics: Research and Applications,2012
5. The effect of emitter recombination on the effective lifetime of silicon wafers;Cuevas;Solar Energy Materials and Solar Cells,1999