Surface transition regions & visible-near UV optical properties of some semiconductors-Reference-Cited by-同舟云学术

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Surface transition regions & visible-near UV optical properties of some semiconductors

Published:1983-03 Issue: Volume:117-118 Page:359-361
ISSN:0378-4363
Container-title:Physica B+C
language:en
Short-container-title:Physica B+C

Author:

Aspnes D.E.

Publisher

Elsevier BV

Subject

General Engineering

Reference8 articles.

1. Ellipsometric studies of adsorption reactions on clean surfaces;Meyer;Surface Sci.,1976

2. Spectroscopic Ellipsometry;Aspnes,1976

3. Berechnung verschiedener physikalischer Konstanten von heterogenen Substanzen;Bruggeman;Ann. Phys.,1935

4. High precision scanning ellipsometer;Aspnes;Appl. Opt.,1975

5. Optical detection and minimization of surface overlayers on semiconductors using spectroscopic ellipsometry;Aspnes,1981

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of r.f. hydrogen plasma annealing on the properties of Si/SiO2 interface: a spectroscopic ellipsometry study;Thin Solid Films;2003-06

2. Spectroscopic ellipsometry for monitoring and control of surfaces, thin layers and interfaces;SURF INTERFACE ANAL;2001

3. Ellipsometry in Analysis of Surfaces and Thin Films;Encyclopedia of Analytical Chemistry;2000-10-30

4. Real-time optical techniques and QMS to characterize growth in a modified commercial OMVPE reactor;Journal of Electronic Materials;2000-01

5. Ellipsometric approach for determination of the pseudodielectric function of the Si–interface in the Si–SiO2 structure;Surface Science;1999-12

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