Small angle neutron scattering study of structural heterogeneities in a-Si : H
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference11 articles.
1. Amorphous and liquid semiconductors;Spear,1974
2. Electronic processes in non crystalline materials;Mott,1979
3. Small-Angle-Scattering Evidence of Voids in Hydrogenated Amorphous Silicon
4. Nature of the structural heterogeneity in SiH films by small angle neutron scattering
5. Small angle x-ray and neutron scattering studies of plasma-deposited amorphous silicon-hydrogen films
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1. Neutron scattering studies of hydrogenated, deuterated and fluorinated amorphous silicon;Journal of Physics: Condensed Matter;2007-09-27
2. Nonuniform H distribution in thin-film hydrogenated amorphous Si by small-angle neutron scattering;Physical Review B;2003-02-27
3. Microvoids in a-Si:H and a-SiGe:H alloys;Solar Energy Materials and Solar Cells;1994-09
4. Classification of Inhomogeneities in Hydrogenated Amorphous Silicon;Japanese Journal of Applied Physics;1991-12-01
5. On the formation process of the Staebler—Wronski effect in a-Si:H deduced from its wavelength dependence;Philosophical Magazine B;1990-03
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