Author:
Zhan Wenfa,Liang Huaguo,Jiang Cuiyun,Huang Zhengfeng,El-Maleh Aiman
Subject
Electrical and Electronic Engineering,General Computer Science,Control and Systems Engineering
Reference28 articles.
1. Test data compression;McCluskey;IEEE Des Test Comput,2003
2. Test compression saves bits, cycles, and money;Cheng;IEEE Des Test Comput,2008
3. Volkerink EH, Khoche A, Rivoir J, et al. Test economics for multi-site test with modern cost reduction techniques. In: Proceedings of the 20th IEEE VLSI test symposium (VTS 2002); 2002. p. 411–16.
4. Krishna CV, Touba NA. Adjustable width linear combinational scan vector decompression. In: Proceedings of the international conference on computer aided design (ICCAD-2003); 2003. p. 863–66.
5. Krishna CV, Touba NA. 3-stage variable length continuous-flow scan vector decompression scheme. In: Proceedings of the 22nd IEEE VLSI test symposium; 2004. p. 79–86.
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献