A practical simulated annealing program and its application to quantitative CBED pattern matching
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference28 articles.
1. For a recent review of QCBED, see J.M. Zuo, Mater. Trans. JIM 39 (1998) 938.
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3. Accurate Structure-Factor Phase Determination by Electron Diffraction in Noncentrosymmetric Crystals
4. K. Marthinsen, R. Hoier, L.N. Bakken, in: L.D. Peachey, D.B. Williams (Eds.), Electron Microscopy 1990, Proceedings of the XIIth ICEM, Vol. 2, San Francisco Press, 1990, p. 492.
5. Inversion of convergent-beam electron diffraction patterns
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