A fuzzy logic approach to image analysis of HREM micrographs of III–V compounds
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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1. ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY;Annual Review of Materials Research;2005-08-04
2. High-Resolution Electron Microscopy of Interfaces between Solids with Varying Degree of Atomic Ordering;Interface Science;2004-04
3. HREM Image Analysis of III-V Heterostructures Based on Neural Networks;physica status solidi (b);2000-11
4. Detection and quantitative assessment of image aberrations from single HRTEM lattice images;Journal of Microscopy;1998-04
5. Fuzzy logic approaches to the analysis of HREM images of III–V compounds;Journal of Microscopy;1998-04
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