Mapping of lateral vibration of the tip in atomic force microscopy at the torsional resonance of the cantilever-Reference-Cited by-同舟云学术

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Mapping of lateral vibration of the tip in atomic force microscopy at the torsional resonance of the cantilever

Published:2002-05 Issue:1-4 Volume:91 Page:37-48
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Kawagishi Takayoshi,Kato Atsushi,Hoshi Yasuo,Kawakatsu Hideki

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference47 articles.

1. Atomic Force Microscope

2. Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope

3. An atomic‐resolution atomic‐force microscope implemented using an optical lever

4. Difference between the forces measured by an optical lever deflection and by an optical interferometer in an atomic force microscope

5. Atomic-scale friction of a tungsten tip on a graphite surface

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