A novel lifetime prediction for integrated LED lamps by electronic-thermal simulation-Reference-Cited by-同舟云学术

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A novel lifetime prediction for integrated LED lamps by electronic-thermal simulation

Published:2017-07 Issue: Volume:163 Page:14-21
ISSN:0951-8320
Container-title:Reliability Engineering & System Safety
language:en
Short-container-title:Reliability Engineering & System Safety

Author:

Sun Bo,Fan Xuejun,Ye Huaiyu,Fan Jiajie,Qian Cheng,van Driel Williem,Zhang Guoqi

Funder

National High-Tech Research and Development Program of China

International Science and Technology Cooperation Program of China

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Safety, Risk, Reliability and Quality

Reference42 articles.

1. Prognostics of lumen maintenance for High power white light emitting diodes using a nonlinear filter-based approach;Fan;Reliab Eng Syst Saf,2014

2. An accelerated test method of Luminous Flux Depreciation for LED luminaires and lamps;Qian;Reliab Eng Syst Saf,2015

3. PoF-Simulation-Assisted Reliability Prediction for electrolytic capacitor in LED drivers;Sun;IEEE Trans Ind Electron,2016

4. Sun B, Fan XJ, Yuan CA, Qian C, Zhang GQ. A degradation model of aluminum electrolytic capacitors for LED drivers. In: Proceedings of the 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE). p. 1–4; 2015.

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