An accelerated test method of luminous flux depreciation for LED luminaires and lamps-Reference-Cited by-同舟云学术

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An accelerated test method of luminous flux depreciation for LED luminaires and lamps

Published:2016-03 Issue: Volume:147 Page:84-92
ISSN:0951-8320
Container-title:Reliability Engineering & System Safety
language:en
Short-container-title:Reliability Engineering & System Safety

Author:

Qian C.,Fan X.J.,Fan J.J.,Yuan C.A.,Zhang G.Q.

Funder

National High-Tech Research and Development Program of China

International Science and Technology Cooperation Program of China

Natural Science Foundation of Jiangsu Province

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Safety, Risk, Reliability and Quality

Reference39 articles.

1. Solid state lighting reliability: components to systems;van Driel,2012

2. Approved method for lumen maintenance testing of LED light source;IES-LM-80-08,2008

3. Projecting long term lumen maintenance of LED light sources;IES-TM-21-11,2011

4. VDE-AR-E 2715-1, Measurement and prediction of reduction in luminous flux of LEDs, German Standard, November 2012.

5. Lifetime estimation of high-power white LED using degradation-data-driven method;Fan;IEEE Trans Device Mater Reliab,2012

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