Probabilistic assessments in relationship with safety integrity levels by using Fault Trees

Author:

Dutuit Y.,Innal F.,Rauzy A.,Signoret J.-P.

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Safety, Risk, Reliability and Quality

Reference9 articles.

1. IEC 61508. Functional safety of electric/electronic/programmable electronic safety-related systems. Parts 1–7; October 1998–May 2000.

2. Innal F, Dutuit Y, Rauzy A, Signoret JP. An attempt to better understand and to better apply some of the recommendations of IEC 61508 standard. In: 30th ESReDA seminar on reliability of safety-critical systems. Trondheim, Norway: SINTEF/NTNU; 7–8 June 2006.

3. Signoret JP. Etude probabiliste des systèmes périodiquement testés: rapport DGEP/SES/ARF/JPS/co no. 86, 009 ELF Aquitaine Production, November 1986 [in French].

4. Dutuit Y, Rauzy A, Signoret JP, Thomas P. Disponibilité d’un système en attente et périodiquement testé. In: Proceedings of the QUALITA 99 conference, Paris, France, 25–26 March 1999, p. 67–375 [in French].

5. Signoret JP. High integrity protection system (HIPS)—overcoming SIL calculation difficulties. TOTAL document, Pau, 2004.

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