Automatic Wheat Leaf Rust Detection and Grading Diagnosis via Embedded Image Processing System-Reference-Cited by-同舟云学术

Automatic Wheat Leaf Rust Detection and Grading Diagnosis via Embedded Image Processing System

Published:2017 Issue: Volume:107 Page:836-841
ISSN:1877-0509
Container-title:Procedia Computer Science
language:en
Short-container-title:Procedia Computer Science

Author:

Xu Peifeng,Wu Gangshan,Guo Yijia,chen Xiaoyin,Yang Hetong,Zhang Rongbiao

Publisher

Elsevier BV

Subject

General Engineering

Reference14 articles.

1. Zhihua Diao. Research and Application of Intelligent System of Field Wheat Leaf Disease Detection. University of Science and Technology of China. A dissertation for doctor's degree; 2010.

2. Mingsheng Hou, Junbin Huang. Agricultural Plant Pathology. China Science Publishing & Media Ltd; 2011.

3. Image recognition of wheat stripe rust and wheat leaf rust based on support vector machine;Guanlin Li;Journal of China Agricultural University,2012

4. Identification of Damage by Diseases and Insect Pests in Winter Wheat;Hongbo Qiao;Journal of Triticeae Crops,2010

5. Identification of Wheat Leaf Diseases Based on SVM Method;Xiuli Yu;Journal of Agricultural Mechanization Research,2014

Cited by 37 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A novel hybrid segmentation technique for identification of wheat rust diseases;Multimedia Tools and Applications;2024-02-09

2. Wheat leaf disease classification using modified ResNet50 convolutional neural network model;Multimedia Tools and Applications;2024-01-09

3. A novel approach for tomato leaf disease classification with deep convolutional neural networks;Tarım Bilimleri Dergisi;2023-12-08

4. Edge Detection Based Segmentation of Wheat Plants Diseases;2023 Seventh International Conference on Image Information Processing (ICIIP);2023-11-22

5. Wheat Diseases Recognition Using Optimal Features Assisted Modified Soft Attention Network;2023 14th International Conference on Information and Communication Technology Convergence (ICTC);2023-10-11