1. Automatic Generation of Memory Built-In Self -Test Cores for System on Chip;Cheng;IEEE conference,2001
2. A programmable memory BIST for Embedded Memory;Hong;International IEEE Conference on SoC Design,2008
3. An Embedded Processor Based SoC Test Platform;Lee;IEEE International Symposium on Circuits and Systems,2005
4. Essentials of Electronic Testing of Digital, Memory and Mixed Signal VLSI Circuits. 3rd ed.;Agarwal,2000
5. On-Chip SOC Test Platform design Based on IEEE1500 Standard;Lee;IEEE transactions on very large scale integration (VLSI) systems,2010