Introgression of chromosome 6PL terminal segment from Agropyron cristatum to increase both grain number and grain weight in wheat-Reference-Cited by-同舟云学术

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Introgression of chromosome 6PL terminal segment from Agropyron cristatum to increase both grain number and grain weight in wheat

Published:2023-06 Issue:3 Volume:11 Page:878-886
ISSN:2214-5141
Container-title:The Crop Journal
language:en
Short-container-title:The Crop Journal

Author:

Lin Yida,Zhou Shenghui,Liang Xuezhong,Han Bing,Yang Junli,Guo Baojin,Zhang Jinpeng,Han Haiming,Liu Weihua,Yang Xinming,Li Xiuquan,Li Lihui

Funder

National Natural Science Foundation of China

Chinese Academy of Agricultural Sciences

Agricultural Science and Technology Innovation Program

Publisher

Elsevier BV

Subject

Plant Science,Agronomy and Crop Science

Reference45 articles.

1. Raising yield potential of wheat, III. optimizing partitioning to grain while maintaining lodging resistance;Foulkes;J. Exp. Bot.,2011

2. Wheat;Shewry;J. Exp. Bot.,2009

3. Genetic modification of spikelet arrangement in wheat increases grain number without significantly affecting grain weight;Wolde;Mol. Genet. Genomics,2019

4. Wheat genetic diversity trends during domestication and breeding;Reif;Theor. Appl. Genet.,2005

5. Overcoming the trade-off between grain weight and number in wheat by the ectopic expression of expansin in developing seeds leads to increased yield potential;Calderini;New. Phytol.,2021

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Development of the novel wheat-tetraploid Thinopyrum elongatum 4EL small fragment translocation lines with the stripe rust resistance gene Yr4EL;2024-08-12

2. Introgression of chromosome 5P from Agropyron cristatum enhances grain weight in a wheat background;Theoretical and Applied Genetics;2024-06-21

3. Chromosomal mapping of a major genetic locus from Agropyron cristatum chromosome 6P that influences grain number and spikelet number in wheat;Theoretical and Applied Genetics;2024-03-15

4. Genomics for Yield and Yield Components in Durum Wheat;Plants;2023-07-07

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