Multilayer CdHgTe-based infrared detector: 2D/3D microtomography, synchrotron emission and finite element modelling with stress distribution at room temperature and 100 K
Author:
Publisher
Elsevier BV
Subject
General Materials Science
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3. Simulation and measurement of residual stress and warpage in a HgCdTe-based infrared detector at 100 K;Materials Science and Engineering: A;2021-05
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