High resolution transmission electron microscopy to study very thin crystalline layers buried at an amorphous–crystalline interface-Reference-Cited by-同舟云学术

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High resolution transmission electron microscopy to study very thin crystalline layers buried at an amorphous–crystalline interface

Published:2000-06 Issue:3 Volume:31 Page:237-243
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Re M,Carlino E,Sorba L,Franciosi A,Müller B.H

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference30 articles.

1. Ferroelectric-semiconductor heterostructures obtained by direct wafer bonding

2. The interpretation of HREM images of crystals

3. Structural characterization of lattice matched AlxIn1−xAs/InP and GayIn1−yAs/InP heterostructures by transmission electron microscopy and high‐resolution x‐ray diffraction

4. Cerius Molecular Modeling Software for Material Research from Molecular Simulation Inc. of Burlington (MA) and Cambridge (UK), 1992.

5. Epitaxial growth of Y2O3 films on Si(100) without an interfacial oxide layer

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