Spectroscopic ellipsometry modeling of ZnO thin films with various O2 partial pressures
Author:
Publisher
Elsevier BV
Subject
General Physics and Astronomy,General Materials Science
Reference21 articles.
1. Effects of the channel thickness on the structural and electrical characteristics of room-temperature fabricated ZnO thin-film transistors
2. Deposition of ZnO thin films by magnetron sputtering for a film bulk acoustic resonator
3. Optical properties of Al-doped ZnO thin films by ellipsometry
4. Influence of oxygen partial pressure on the structure and photoluminescence of direct current reactive magnetron sputtering ZnO thin films
5. ZnO/Al2O3 nanolaminates fabricated by atomic layer deposition: growth and surface roughness measurements
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4. Increasing the silicon solar cell efficiency with transition metal oxide nano-thin films as anti-reflection coatings;Materials Research Express;2020-01-01
5. SPECTROSCOPIC ELLIPSOMETRY STUDIES ON ZINC OXIDE THIN FILMS DEPOSITED BY SOL–GEL METHOD WITH VARIOUS PRECURSOR CONCENTRATIONS;Surface Review and Letters;2019-03-24
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