Compensation of stray capacitance of the quartz tuning fork for a quantitative force spectroscopy
Author:
Publisher
Elsevier BV
Subject
General Physics and Astronomy,General Materials Science
Reference29 articles.
1. Advances in atomic force microscopy
2. Low temperature electrostatic force microscopy of a deep two-dimensional electron gas using a quartz tuning fork
3. Electronic driver with amplitude and quality factor control to adjust the response of quartz tuning fork sensors in atomic force microscopy applications
4. Combined dynamic scanning tunneling microscopy and frequency modulation atomic force microscopy investigations on polythiophene chains on graphite with a tuning fork sensor
5. Application of the equipartition theorem to the thermal excitation of quartz tuning forks
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1. Compensation of Parasitic Capacitance of Quartz Tuning Fork in AFM;Journal of Applied Mathematics and Physics;2023
2. Enhancing sensitivity in atomic force microscopy for planar tip-on-chip probes;Microsystems & Nanoengineering;2022-05-16
3. Sorting Gold and Sand (Silica) Using Atomic Force Microscope-Based Dielectrophoresis;Nano-Micro Letters;2021-12-04
4. Mathematical extraction of mechanical characteristics from electrical signals from an electrically driven quartz tuning fork in vacuum, air, and liquid environments;Journal of the Korean Physical Society;2021-06-18
5. Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors;Review of Scientific Instruments;2019-01
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