An S-shaped software reliability growth model with two types of errors-Reference-Cited by-同舟云学术

An S-shaped software reliability growth model with two types of errors

Published:1990-01 Issue:6 Volume:30 Page:1085-1090
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Kareer Nishi,Kapur P.K.,Grover P.S.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Software Engineering: Metrics and Models;Conte,1986

2. Software reliability models: a review;Shantikumar;Microelectron. Reliab.,1983

3. Reliability growth models for hardware and software systems based on nonhomogeneous poisson process: a survey;Yamada;Microelectron. Reliab.,1983

4. Software reliability models: assumptions, limitations, and applicability;Goel;IEEE Trans. Software Engng,1985

5. Software Reliability: Measurement, Prediction, Application;Musa,1987

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