Author:
Yamada Shigeru,Osaki Shunji
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference47 articles.
1. Probability, Statistics and Queueing Theory;Allen,1978
2. ‘Bad as Old’ analysis of system failure data;Ascher,1969
3. Inferences on the parameters and current system reliability for a time truncated Weibull process;Bain;Technometrics,1980
4. Reliability proving for commercial products;Beachler,1977
5. Growth modeling improves reliability predictions;Bezat,1975
Cited by
55 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献