Common-cause failures and critical human errors in repairable and non-repairable systems-Reference-Cited by-同舟云学术

Common-cause failures and critical human errors in repairable and non-repairable systems

Published:1990-01 Issue:2 Volume:30 Page:243-247
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Who Kee Chung

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. On common-cause failures-a bibliography;Dhillon;Microelectron. Reliab.,1979

2. A k-out-of-N:G redundant system with dependent failure rates and common-cause failures;Who Kee Chung;Microelectron. Reliab.,1988

3. An availability analysis of a k-out-of-N:G redundant system with dependant failure rates and common-cause failures;Who Kee Chung;Microelectron. Reliab.,1988

4. Who Kee Chung, Reliability analysis of repairable and non-repairable system with common-cause of failures, (accepted by Microelectron. Reliab.)

5. On human reliability-bibliography;Dhillon;Microelectron. Reliab.,1980

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Availability and reliability of a parallel system under imperfect repair and replacement: analysis and cost optimization;International Journal of System Assurance Engineering and Management;2019-09-05

2. Reliability evaluation of k-out-of-n redundant system with partially energized stand-by units;Microelectronics Reliability;1996-03

3. Reliability analysis of a k-out-of-N : G redundant system with multiple critical errors;Microelectronics Reliability;1990-01