A k-out-of-N:G redundant system with dependent failure rates and common-cause failures-Reference-Cited by-同舟云学术

A k-out-of-N:G redundant system with dependent failure rates and common-cause failures

Published:1988-01 Issue:2 Volume:28 Page:201-203
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Who Kee Chung

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Power-System Reliability Calculations;Billinton,1973

2. On common-cause failures—bibliography;Dhillon;Microelectron. Reliab.,1979

3. On human reliability—bibliography;Dhillon;Microelectron. Reliab.,1980

4. Mechanical reliability: interference theory models;Dhillon,1980

5. Bibliography of literature on medical equipment reliability;Dhillon;Microelectron. Reliab.,1980

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