Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Cited by
7 articles.
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1. Temperature dependence of microelectronic device failures;Quality and Reliability Engineering International;1990-09
2. A Multivalued Algebra For Modeling Physical Failures in MOS VLSI Circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;1985-07
3. Failure physics of integrated circuits and relationship to reliability;Physica Status Solidi (a);1983-01-16
4. Failure physics of integrated circuits — A review;Microelectronics Reliability;1983-01
5. Packaging;Semiconducting Devices;1976