Author:
Acovic Alexander,La Rosa Giuseppe,Sun Yuan-Chen
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference152 articles.
1. A high performance 0.25 μm CMOS technology. I. Design and characterization;Chang;IEEE Trans. El. Devices,1992
2. Design of ion-implanted MOSFETs with very small physical dimensions;Dennard;IEEE J. Solid-State Circuits,1974
3. ASIC family crams up to 1.2M usable gates/chip;Bursky;Electronic Design,1993
4. A high performance 0.15 μm CMOS;Shahidi,1993
5. Where do hot-electrons come from?;Frey;IEEE Circuits&Devices Magazine,1991
Cited by
75 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献