Reliability survival equivalence-Reference-Cited by-同舟云学术

Reliability survival equivalence

Published:1993-05 Issue:6 Volume:33 Page:881-894
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Råde Lennart

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. L. Råde, Reliability Equivalence, Studies in Statistical Quality Control and Reliability 1989-1, Mathematical Statistics, Chalmers University of Technology.

2. L. Råde, Reliability Systems of 3-state components, Studies in Statistical Quality Control and Reliability 1990-3, Mathematical Statistics, Chalmers University of Technology.

3. L. Råde, Performance Measures for Reliability Systems with a Cold Stand-by with a Random Switch, Studies in Statistical Quality Control and Reliability 1991-, Chalmers University of Technology.

4. Reliability Equivalence;Råde;Microelectron. Reliab.,1993

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