Reliability equivalence-Reference-Cited by-同舟云学术

Reliability equivalence

Published:1993-02 Issue:3 Volume:33 Page:323-325
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Råde L.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. L. Råde, Reliability equivalence, In Studies in Statistical Quality Control and Reliability 1989-1. Mathematical Statistics, Chalmers University of Technology.

2. L. Råde, Reliability systems of three-state components, In Studies in Statistical Quality Control and Reliability 1990-3. Mathematical Statistics, Chalmers University of Technology.

3. L. Råde, Performance measures for reliability systems with a cold standby with a random switch. Mathematical Statistics, Chalmers University of Technology.

4. Expected time to failure of reliability systems;Råde,1989

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