Author:
Pierrel J.P.,May D.,Bourdin L.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Dynamic fault imaging of VLSI random logic devices;May,1984
2. Failure Analysis Using E-Beam;Collin;Microelectronic Enginneering,1990
3. Towards automatic diagnostic: E-Beam tester database environment;Primot,1991
4. High precision electron beam positioning using computer image analysis for electron beam testing;Michener;Microelectronic Engineering,1987
5. A class of algorithms for fast digital image registration;Barnea;IEEE Transactions on Computer,1972