AC effects in IC reliability-Reference-Cited by-同舟云学术

AC effects in IC reliability

Published:1996-11 Issue:11-12 Volume:36 Page:1611-1617
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Hu Chenming

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Hot Carrier Induced MOSFET Degradation Under AC Stress;Choi;IEEE Electron Device Letters,1987

2. Hot Carrier Related Device Reliability for Digital and Analogue CMOS Circuits;Weber;Semicond. Sci. Technol.,1995

3. Projecting CMOS Circuit Hot-Carrier Reliability from DC Device Lifetime;Quader,1993

4. Hot-Carrier Design Rules for Translating Device Degradation to CMOS Digital Circuit Degradation;Quader;IEEE Trans. Electron Devices,1994

5. Projecting Interconnect EM Lifetime for Arbitrary Current Waveforms;Liew;IEEE Trans. Electron Devices,1990

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