Computer-Aided Analog Circuit Design for Reliability in Nanometer CMOS-Reference-Cited by-同舟云学术

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Computer-Aided Analog Circuit Design for Reliability in Nanometer CMOS

Published:2011-03 Issue:1 Volume:1 Page:50-58
ISSN:2156-3357
Container-title:IEEE Journal on Emerging and Selected Topics in Circuits and Systems
language:
Short-container-title:IEEE J. Emerg. Sel. Topics Circuits Syst.

Author:

Maricau Elie,Gielen Georges

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/5503868/5772128/05762376.pdf?arnumber=5762376

Cited by 45 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characterizing Aging Degradation of Integrated Circuits with a Versatile Custom Array of Reliability Test Structures;2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS);2022-03-21

2. An Equivalent Circuit Model for Negative Bias Temperature Instability Effect in 65nm PMOS;2021 6th International Conference on Integrated Circuits and Microsystems (ICICM);2021-10-22

3. Circuit reliability prediction: challenges and solutions for the device time-dependent variability characterization roadblock;2021 IEEE Latin America Electron Devices Conference (LAEDC);2021-04-19

4. Fault data screening and failure rate prediction framework-based bathtub curve on industrial robots;Industrial Robot: the international journal of robotics research and application;2020-08-12

5. Reliability-Aware Design Space Exploration for Fully Integrated RF CMOS PA;IEEE Transactions on Device and Materials Reliability;2020-03

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