Author:
Russ C.,Verhaege K.,Bock K.,Groeseneken G.,Maes H.E.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. How Fast Does a Protection Device Turn On?;Duvvury;Threshold — ESD Association Newsletter, December,1995
2. Circuit-Level Electrothermal Simulation of Electrical Overstress Failures in Advanced MOS I/O Protection Devices;Diaz;IEEE Trans. on CAD of ICs and Circuits,1994
3. Compact Electro-Thermal Simulation of ESD-Protection Elements;Russ;Quality and Reliability Engineering International,1994
4. Modelling MOS Snapback and Parasitic Bipolar Action for Circuit-Level ESD and High Current Simulations;Amerasekera,1996
5. A Compact Model for the Grounded-Gate nMOS Behaviour under CDM ESD Stress;Russ,1996
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