A reparable multistate device with arbitrarily distributed repair times-Reference-Cited by-同舟云学术

A reparable multistate device with arbitrarily distributed repair times

Published:1981-01 Issue:2 Volume:21 Page:255-256
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Chung Who Kee

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Reliability Theory and Practice;Bazovsky,1961

2. System Reliability Engineering;Sandler,1963

3. Mathematical Models in Reliability Engineering;Roberts,1964

4. Probabilistic Reliability: An Engineering Approach;Shooman,1968

5. The graphical evaluation of three-state device networks;Proctor;Microelectron. Reliab.,1975

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Adaptive Observer Design for a Multi-State Reparable System;2024 American Control Conference (ACC);2024-07-10

2. Bilinear Controllability of a Simple Reparable System;2024 European Control Conference (ECC);2024-06-25

3. Dynamic Analysis of the Multi-state Reliability System with Priority Repair Discipline;Acta Mathematicae Applicatae Sinica, English Series;2023-07-19

4. Failure Rate Identification of a Reparable System Governed by Coupled ODE-PDEs and Deep Learning based Implementation;2023 American Control Conference (ACC);2023-05-31

5. Optimal bilinear control of a reparable multi-state system;International Journal of Control;2020-09-29