The graphical reliability evaluation of three-state device networks-Reference-Cited by-同舟云学术

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The graphical reliability evaluation of three-state device networks

Published:1975-04 Issue:2 Volume:14 Page:203-214
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Proctor C.L.,Singh Balbir

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. Reliability of Parallel Electronic Components;Price;Trans. I.R.E. (Reliability and Quality Control),1960

2. Redundancy and the Detection of First Failures;James;Trans. I.R.E. (Reliability and Quality Control),1962

3. Reliability Engineering,1964

4. Reliability of Three-State Device Networks;Proctor,1975

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Graphical Methods for Reliability Data;Wiley Encyclopedia of Operations Research and Management Science;2013-01-15

2. Asymptotic property of a reparable multi-state device;Quarterly of Applied Mathematics;2005-10-18

3. Consecutive-k, r-out-of-n:DFM systems;Microelectronics Reliability;1997-04

4. Two reduced formulas for reliability evaluation of three-state device networks;Microelectronics Reliability;1995-04

5. A new algorithm for reliability evaluation of three-state device complex networks: Minimal cut-minimal path method;Microelectronics Reliability;1994-09

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