The use of x-ray topography for the observation and characterization of gross imperfections in sapphire single crystals-Reference-Cited by-同舟云学术

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The use of x-ray topography for the observation and characterization of gross imperfections in sapphire single crystals

Published:1967-04 Issue:4 Volume:2 Page:449-458
ISSN:0025-5408
Container-title:Materials Research Bulletin
language:en
Short-container-title:Materials Research Bulletin

Author:

Walford L.K.,Cargill G.S.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference5 articles.

1. X-ray Studies of Sapphire Crystal Perfection;Bemstein,1964

2. Imperfections in Ruby for Maser Applications;Bams,1962

3. Perfection of Ruby Laser Crystals

4. X-Ray Topography of Ruby Crystals;Birks;NRL Report No. 6087,1964

5. The projection topograph: a new method in X-ray diffraction microradiography

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Growth of large diameter lithium niobate single crystals by czochralski method;Ferroelectrics;1990-02

2. Study of Crystal Perfection of CVD‐Grown α ‐ Al2 O 3 Single Crystals by Transmission X‐Ray Diffraction Topography;Journal of The Electrochemical Society;1978-12-01

3. An x-ray topographic study on lithium niobate single crystals;Journal of Crystal Growth;1973-02

4. X-Ray Diffraction Microscopy;Microstructural Analysis;1973

5. Synthetic corundum as an X-Ray monochromator;X-Ray Spectrometry;1972-04

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