X-Ray Diffraction Microscopy-Reference-Cited by-同舟云学术

X-Ray Diffraction Microscopy

Published:1973 Issue: Volume: Page:169-219
ISSN:
Container-title:Microstructural Analysis
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Author:

Armstrong R. W.,Wu C. Cm.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4615-8693-7_8.pdf

Reference350 articles.

1. C. S. Barrett: “Laue Spots from Perfect, Imperfect and Oscillating Crystals,” Phys. Rev. 38, 832 (1931).

2. W. F. Berg: “Uber ein rontgenographische Methode zur Untersuchung von Gitterstorungen an Kristallen,” Naturwissenschaften 19, 391 (1931): “About the History of Load of Deformed Crystals, Z Kristallogr. 89, 286 (1934).

3. C. S. Barrett: “A New Microscopy and Its Potentialities,” Trans. IMD-AIME 161, 15 (1945).

4. G. Borrmann: “Uber Extinktionsdiagramme von Quarz,” Phys. Zeits. 42, 157 (1941); “Die Absorption von Rontgenstrahlen im Fall der Interferenz,” Zeits. f. Phys. 127, 297 (1950).

5. M. von Laue: Rontgenstrahlinterferenzen (Akademische Verlagsges, Frankfurt am Main, 1941).

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