Probing inhomogeneities in nanoscale organic semiconductor films: Depth profiling using slow positron beam and X-ray reflectivity techniques-Reference-Cited by-同舟云学术

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Probing inhomogeneities in nanoscale organic semiconductor films: Depth profiling using slow positron beam and X-ray reflectivity techniques

Published:2014-12 Issue: Volume:200 Page:22-28
ISSN:0038-1098
Container-title:Solid State Communications
language:en
Short-container-title:Solid State Communications

Author:

Maheshwari Priya,Bhattacharya D.,Sharma S.K.,Mukherjee S.,Samanta S.,Basu S.,Aswal D.K.,Pujari P.K.

Funder

Indian Institute of Technology Bombay, Mumbai 400076, India

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,General Chemistry

Reference41 articles.

1. Pentacene Thin Film Growth

2. The Role of OTS Density on Pentacene and C 60 Nucleation, Thin Film Growth, and Transistor Performance

3. Interface engineering in organic transistors

4. The path to ubiquitous and low-cost organic electronic appliances on plastic

5. The electronic structure of C60/ZnPc interface for organic photovoltaic device with blended layer architecture

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1. Dense Cr/GLC multilayer coating by HiPIMS technique in high hydrostatic pressure: Microstrusctural evolution and galvanic corrosion failure;Corrosion Science;2023-12

2. Controlling the compactness and sp2 clusters to reduce interfacial damage of amorphous carbon/316L bipolar plates in PEMFCs;International Journal of Hydrogen Energy;2022-03

3. Defect depth profiling of sputter-deposited Cu/Nb bilayers using a positron accelerator;Surfaces and Interfaces;2021-10

4. Recent Progresses in Nanometer Scale Analysis of Buried Layers and Interfaces in Thin Films by X-rays and Neutrons;Analytical Sciences;2020-08-10

5. Structure and density profile of diamond-like carbon films containing copper: Study by X-ray reflectivity, transmission electron microscopy, and spectroscopic ellipsometry;Thin Solid Films;2017-05

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