The long-range ordering, electron spectrum, and properties of amorphous silicon films – II. Defect states and optical parameters
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference43 articles.
1. Small-Angle-Scattering Evidence of Voids in Hydrogenated Amorphous Silicon
2. Positron‐lifetime studies of hydrogenated amorphous silicon
3. Characterization of microvoids in device-quality hydrogenated amorphous silicon by small-angle x-ray scattering and infrared measurements
4. The effects of hydrogen partial pressure on reactively sputtered amorphous silicon
5. Deuteron and proton magnetic resonance in amorphous silicon
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2. Correlations among hydrogen bonding configuration, structural order and optical coefficients in hydrogenated amorphous germanium obtained by x-ray-activated chemical vapour deposition;Journal of Physics D: Applied Physics;2009-04-27
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