Characterization of microvoids in device-quality hydrogenated amorphous silicon by small-angle x-ray scattering and infrared measurements
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.40.12024/fulltext
Reference26 articles.
1. Multiple-Quantum NMR Study of Clustering in Hydrogenated Amorphous Silicon
2. Molecular hydrogen ina-Si: H
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5. Influence of microstructure on the photoconductivity of glow discharge deposited amorphous SiC:H and amorphous SiGe:H alloys
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