Author:
Tsai Tsung-Lun,Lee Chia-Yen
Subject
Artificial Intelligence,Industrial and Manufacturing Engineering
Reference15 articles.
1. C. Y. Lee, C.H. Chen & C. F. Chien, A simulation analysis for evaluating TFT-LCD fab capacity expansion with a distant transportation problem, International Journal of Production Research, vol. 52:6, 2014, pp. 1868-1885.
2. G. E. Moore, Cramming more components onto integrated circuits, Reprinted from Electronics, vol. 38, number 8, April 19, 1965, pp. 114 ff, IEEE Solid-State Circuits Newsletter, vol. 3, 2006, pp. 33-35.
3. L.B. Sun, X.L. Hu, Y. Xu, Q.J. Wu, B. Shi, M. Ye, L.S. Wang, J. Zhao, X.L. Li, Y.Q. Wu, S.M. Yang, R.Z. Tai, H.J. Fecht, J.Z. Jiang, D.X. Zhang, Influence of film thickness and nanograting period on color-filter behaviors of plasmonic metal Ag films, Original Research Article Optics Communications, vol. 333, 2014, pp. 16-21.
4. M. Efroymson, Multiple regression analysis, Mathematical methods for digital computers, vol. 1, 1960, pp. 191-203.
5. J. Friedman, T. Hastie, and R. Tibshirani, The elements of statistical learning vol. 1. 2nd ed.: Springer series in statistics Springer, Berlin, 2001.
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