Roles of chemical metrology in electronics industry and associated environment in Korea: A tutorial-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Roles of chemical metrology in electronics industry and associated environment in Korea: A tutorial

Published:2015-03 Issue: Volume:134 Page:284-291
ISSN:0039-9140
Container-title:Talanta
language:en
Short-container-title:Talanta

Author:

Kang Namgoo^ORCID,Joong Kim Kyung,Seog Kim Jin,Hae Lee Joung

Funder

Korea Research Institute of Standards and Science

Korea Research Council of Fundamental Science and Technology

Development of Greenhouse Gases Measurement Technology for Solving Climate Change

Publisher

Elsevier BV

Subject

Analytical Chemistry

Reference44 articles.

1. A review of focused ion beam applications in microsystem technology

2. Recent advances in focused ion beam technology and applications

3. Versailles Project on Advanced Materials and Standards (VAMAS), 〈http://www.vamas.org/twa2/index.html〉.

4. Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Coupling Relationship Analysis between Quality Infrastructure and Ecological Environment Quality for Policy Implications;International Journal of Environmental Research and Public Health;2020-10-19

2. International Comparison CCQM-K15: Emission level of CF4 and SF6;Metrologia;2006-01

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP